HAXIS Low-angle Ion Milling Scanning Electron Microscope. Background of development. As advanced semiconductor device str ...
JEOL Ltd. announced the development of its new low-angle ion-milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS is JEOL's new semiconductor failure analysis ...
How much do olive harvesters damage the fruit?Considering 'Harvest Damage' through FEM AnalysisWhen thinking about olive oil ...
There are many ways to observe mitochondria now, aren't there? But in reality, every technique inevitably has some trade-offs ...
A landmark reanalysis of Arctic sediment cores resolves a 50-year taxonomic mystery, revealing that two distinct warm-water ...
A new study reveals the microscopic anatomy and elemental chemistry that allow the endemic Turkish flax Linum mucronatum ...
Hitachi High-Tech Corporation ("Hitachi High-Tech"), has established a demonstration laboratory Advanced-Technology Innovation Center Mumbai for analytical systems in Mumbai, India ("Mumbai Lab") on ...
Researchers engineered a stretchable pressure-sensitive composite that combines carbon nanofibers and carbon black ...
In this Power Corner interview, Thomas Rodgers, Head of Business Sector Electronics of Zeiss Microscopy, discusses failure ...
Chinese car manufacturers aren’t the only ones trying to develop new types of batteries. In Norwegian laboratories, new ...
Bio-enhanced lightweight concrete showed bacteria-associated mineral deposition and improved mechanical recovery, ...
Hitachi High-Tech Corporation ("Hitachi High-Tech"), has established a demonstration laboratory Advanced-Technology ...
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