HAXIS Low-angle Ion Milling Scanning Electron Microscope. Background of development. As advanced semiconductor device str ...
When you try to look at the cross-section of a newly developed alloy or try to determine the cause of a broken part, have you ever wondered, "Where did this crack start?" or "How big are the grains on ...
JEOL Ltd. announced the development of its new low-angle ion-milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS is JEOL's new semiconductor failure analysis ...
A landmark reanalysis of Arctic sediment cores resolves a 50-year taxonomic mystery, revealing that two distinct warm-water ...
How much do olive harvesters damage the fruit?Considering 'Harvest Damage' through FEM AnalysisWhen thinking about olive oil ...
A new study reveals the microscopic anatomy and elemental chemistry that allow the endemic Turkish flax Linum mucronatum ...
Hitachi High-Tech Corporation ("Hitachi High-Tech"), has established a demonstration laboratory Advanced-Technology Innovation Center Mumbai for analytical systems in Mumbai, India ("Mumbai Lab") on ...
Researchers engineered a stretchable pressure-sensitive composite that combines carbon nanofibers and carbon black ...
In this Power Corner interview, Thomas Rodgers, Head of Business Sector Electronics of Zeiss Microscopy, discusses failure ...
Chinese car manufacturers aren’t the only ones trying to develop new types of batteries. In Norwegian laboratories, new ...
A severely deformed 1834 British silver sixpence preserves physical evidence most consistent with an unusual minting anomaly, according to an IA STUDIO study published in npj Heritage Science. The ...
Bio-enhanced lightweight concrete showed bacteria-associated mineral deposition and improved mechanical recovery, ...
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