JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026.
HAXIS Low-angle Ion Milling Scanning Electron Microscope. Background of development. As advanced semiconductor device str ...
GeoDict Quantify gives micro-CT and FIB-SEM users a professional analysis solution that goes beyond visualization and basic ...
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